Abstract

Multilayer thin-film systems with a magnetooptic layer are employed in the fabrication of erasable optical disks for data storage. We have developed a computer code to address multilayer stacks of anisotropic thin films and have used this technique in the study of magnetooptic disk media. The technique can analyze the performance of the system for an arbitrary angle of incidence and state of polarization. The approach is based on Yeh’s 4 × 4 matrix formalism¹ to treat anisotropic layers. Reflection and transmission coefficients and the state of polarization of the reflected and transmit ted fields can be calculated. Kerr and Faraday rotations relevant to magnetooptic media can also be obtained.

© 1987 Optical Society of America