Author Affiliations

A. Ball,¹ J. Wu,¹ D. Fomra,¹ R. Secondo,^1,2 S. Saha,¹ M. Sojib,¹ J. B. Khurgin,³ H. J. Lezec,⁴ and N. Kinsey^1,*

¹Dept. of Electrical & Computer Engineering, Virginia Commonwealth University, Richmond, VA 23284, USA

²Materials and Manufacturing Directorate, Air Force Research Laboratory, 2179 12th St. Wright-Patterson Air Force Base, Ohio 45433, USA

³Dept. of Electrical & Computer Engineering, Johns Hopkins University, Baltimore, MD 21218, USA

⁴National Institutes of Standards and Technology, Gaithersburg, MD 20899 USA

^*Corresponding author: nkinsey@vcu.edu