Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

3-D Inspection using Multi-Stripe Structured Light

Not Accessible

Your library or personal account may give you access

Abstract

A number of methods have been demonstrated for 3-D coordinate measurements of an image. These include time of flight, stereo matching, and structured light. Most commercially available systems employ structured light, as this technique affords the resolution and speed required for many industrial tasks. In this paper we discuss a structured light 3-D inspection system with the potential for high speed and no moving parts.

© 1985 Optical Society of America

PDF Article
More Like This
A Calibration Method for MEMS Mirror Based Structured Light 3D Modeling System Using Striped Patterns

Di Yang, Dayong Qiao, and Changfeng Xia
FM6C.5 Frontiers in Optics (FiO) 2021

Three-dimensional vision using structured illumination

Steven K. Case, Jeffrey A. Jalkio, and Richard C. Kim
THZ1 OSA Annual Meeting (FIO) 1985

Digital Automated Visual Inspection with Darkfield Microscopy

Jorge L.C. Sanz, Fritz Merkle, and Kwan Y. Wong
ThA3 Machine Vision (MV) 1985

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.