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Conferences > MSNP > 1995 > MFA > MFA3

Laser Diagnostics of Film Properties by Coherent Surface Wave Pulses

Peter Hess

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Abstract

Thin and ultrathin films play an increasing role in science and technology. In most cases conventional methods cannot be used to measure the mechanical and elastic properties of these films. Therefore, new techniques for the analysis of layered structures with nanoscale depth resolution are urgently needed.

© 1995 Optical Society of America

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