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Conferences > LS > 2012 > LTh1J > LTh1J.2

Phase interrogation sensitivity analysis for surface plasmon resonance sensors

Zhiyou Wang, Zheng Zheng, Yusheng Bian, and Jinsong Zhu

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Abstract

Sensitivity of phase interrogation using surface plasmon resonance sensors with various metal film thicknesses are analyzed at different wavelengths. Theoretical analysis reveals that reasonable sensitivities with moderate dynamic ranges can be obtained under specific configurations.

© 2012 Optical Society of America

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