Four resolution enhancement microscopy methods based on parallel detection are demonstrated containing confocal microscopy with four pinhole sizes, Fluorescence Emission Difference Microscopy (FED) based on parallel detection, Airyscan microscopy and Virtual k-vector modulation optical microscopy (Vikmon). These methods use different algorithms to process the data from parallel detection in order to improve the resolution. We investigate these methods first in simulation and then using experiment data, the basic theory are introduced briefly and the ability of resolution improvement of these methods are analyzed synthetically.

© 2016 Optical Society of America

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