Abstract

Surface enhanced Raman scattering (SERS) is, potentially, a very powerful technique for in situ surface analysis, particularly in an electrochemical environment. Unfortunately, few studies to date have taken advantage of the technique for the purpose of analysis. The present study, however, utilizes SERS to probe analyte molecules in the electrochemical double layer in order to obtain information about the behavior of the double layer as the electrode potential is altered.

© 1987 Optical Society of America