Single-Pixel Structured Illumination Microscopy

Luis Ordóñez; Armin J. M. Lenz; Jesús Lancis; Enrique Tajahuerce

doi:10.1364/ISA.2023.IW4E.3

Optica Imaging Congress (3D, COSI, DH, FLatOptics, IS, pcAOP)
Technical Digest Series (Optica Publishing Group, 2023),
paper IW4E.3
•https://doi.org/10.1364/ISA.2023.IW4E.3

Single-Pixel Structured Illumination Microscopy

Luis Ordóñez, Armin J. M. Lenz, Jesús Lancis, and Enrique Tajahuerce

Imaging Systems and Applications 2023

Boston, Massachusetts United States
14–17 August 2023
ISBN: 978-1-957171-28-9

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Microcopy, Imaging, and Super-resolution II (IW4E)

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L. Ordóñez, A. J. M. Lenz, J. Lancis, and E. Tajahuerce, "Single-Pixel Structured Illumination Microscopy," in Optica Imaging Congress (3D, COSI, DH, FLatOptics, IS, pcAOP), Technical Digest Series (Optica Publishing Group, 2023), paper IW4E.3.

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Abstract

We describe a single-pixel imaging microscope with super-resolution properties based on structured illumination microscopy. Spatially resolved patterns are used to expand the frequency spectrum of sampling patterns in the Fourier space.

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