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Conferences > ISA > 2022 > ITh4D > ITh4D.1

Dual-wavelength comb-swept laser to solve distance aliasing for multi-layer measurement

Seongjin Bak, Gyeong Hun Kim, Hansol Jang, and Chang-Seok Kim

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Abstract

In this research, we have proposed a dual-wavelength comb-swept laser and optical Vernier sampling technique for multi-layer measurement. With the proposed measurement system, we can measure multi-layer targets without distance aliasing.

© 2022 The Author(s)

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