Improving the resolution in raster scanning microscopy using Fourier ptychography

Seyed Mohammad Mahdi Khamoushi; Seyed Hassan Tavassoli; Ángel David Rodríguez; Enrique Tajahuerce; Jesús Lancis

doi:10.1364/3D.2016.JT3A.33

Imaging and Applied Optics 2016
(Optica Publishing Group, 2016),
paper JT3A.33
•https://doi.org/10.1364/3D.2016.JT3A.33

Improving the resolution in raster scanning microscopy using Fourier ptychography

Seyed Mohammad Mahdi Khamoushi, Seyed Hassan Tavassoli, Ángel David Rodríguez, Enrique Tajahuerce, and Jesús Lancis

Imaging Systems and Applications 2016

Heidelberg Germany
25–28 July 2016
ISBN: 978-1-943580-15-6

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S. M. M. Khamoushi, S. H. Tavassoli, Á. D. Rodríguez, E. Tajahuerce, and J. Lancis, "Improving the resolution in raster scanning microscopy using Fourier ptychography," in Imaging and Applied Optics 2016, (Optica Publishing Group, 2016), paper JT3A.33.

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Abstract

Raster scanning is a method which can be useful in different kinds of imaging techniques. Using simulations, we show that Fourier ptychography algorithm can improve raster scanning resolution, even using objectives with low NA.

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