Direct Measurement of Refractive Index Profiles of Ti:LINBO3 Planar and Stripe Waveguides by Reflectivity Profiling

J. Steffen; A. Neyer; E. Voges

doi:10.1364/IGWO.1989.MEE10

Integrated and Guided-Wave Optics
Technical Digest Series (Optica Publishing Group, 1989),
paper MEE10
•https://doi.org/10.1364/IGWO.1989.MEE10

Direct Measurement of Refractive Index Profiles of Ti:LINBO₃ Planar and Stripe Waveguides by Reflectivity Profiling

J. Steffen, A. Neyer, and E. Voges

Integrated and Guided Wave Optics 1989

Houston, Texas United States
6–8 February 1989
ISBN:

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Poster Session (MEE)

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J. Steffen, A. Neyer, and E. Voges, "Direct Measurement of Refractive Index Profiles of Ti:LINBO3 Planar and Stripe Waveguides by Reflectivity Profiling," in Integrated and Guided-Wave Optics, Technical Digest Series (Optica Publishing Group, 1989), paper MEE10.

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Abstract

The reflectivity measurement of angular polished surfaces of Ti:LiNbO₃ waveguides is utilized to determine directly the refractive index profiles of planar and stripe waveguides with an accuracy of Δn/n = 10^-4 and a local resolution of <0.1 μm in depth and <1 μm in width.

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