Abstract

The increasing use of optical techniques for telecommunications, sensing and signal processing has generated much interest in the analysis of electro-magnetic radiation in open dielectric waveguide structures. Many opto-e1ectronic devices are planar, with rectangular refractive index distributions produced by the deposition of successive layers of different composition. The analysis of light propagation in such structures is much harder than, for example, optical fibres because of the lack of symmetry, the rectangular profiles and, in some cases, the large changes in refractive index.

© 1988 Optical Society of America