Abstract

The optical path or equivalently the refractive index as a function of spatial coordinate in gradient index germanium-silicon alloy crystals has been measured using A.C interferometric techniques. The interferometer is capable of high phase resolution and is computer controlled for real time data processing. Three crystals grown via the Czochralski method were measured. These results were compared to a theoretical model of the refractive index profile which is based on the dynamics of the growth process and the physical properties of germanium/ silicon alloys [1,2].

© 1987 Optical Society of America