Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > FiO > 2023 > JM4A > JM4A.64

Towards Ultrasensitive Phase-Shift Metrology with Nonlinear Optical Transient Detection

Adolfo Esteban-Martín, José J. Esteve-Taboada, Fernando Silva, Eugenio Roldán, Javier García-Monreal, and Germán J. de Valcárcel

Not Accessible

Your library or personal account may give you access

Abstract

Optical interferometry provides the most accurate spatial measurements. Here, we demonstrate, experimentally and theoretically, a massive improvement over existing techniques using nonlinear photorefractive wave-mixing and tabletop Mach-Zehnder interferometers, allowing displacement measurements with sub-nanometer accuracy.

© 2023 The Author(s)

PDF Article
More Like This
Temporal Fourier-Transform Phase Retrieval in Photorefractive Optical Transient Detection

Javier García-Monreal, Fernando Silva, Eugenio Roldán, Germán J. de Valcárcel, and A. Esteban-Martín
ef_p_17 European Quantum Electronics Conference (EQEC) 2023

Nonlinear-crystals-based optical transient detection system with femtosecond pulses

Sukeert, S. Chaitanya Kumar, P. G. Schunemann, G. J. de Valcárcel, M. Ebrahim-Zadeh, and A. Esteban-Martín
cd_p_19 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2023

Complete Optical Pulse Metrology by Phase-Preserving Nonlinear Autocorrelation

Alexander Gliserin, Soo Hoon Chew, Seungchul Kim, and Dong Eon Kim
JW2A.38 CLEO: Applications and Technology (CLEO:A&T) 2023

View More...

Poster Presentation

Media 1: PDF (5896 KB)     
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use