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Conferences > FiO > 2023 > JM4A > JM4A.51

Rapid Determination of Layer Number in Two-dimensional Materials using Four-wave Mixing Spectroscopy

Torben L. Purz, Eric W. Martin, Adam Alfrey, Yuhang Cao, Hui Deng, and Steven T. Cundiff

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Abstract

We demonstrate a rapid non-contact determination of layer thickness for exfoliated transition metal dichalcogenides using hyperspectral four-wave mixing imaging, which can be applied for in-situ growth characterization. We corroborate the measurements using atomic force microscopy.

© 2023 The Author(s)

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