Highly Simplified Device for Measuring the Intensity and Phase of Picosecond Pulses

Jacob Cohen; Dongjoo Lee; Vikrant Chauhan; Rick Trebino

doi:10.1364/FIO.2010.FThD3

Frontiers in Optics 2010/Laser Science XXVI
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper FThD3
•https://doi.org/10.1364/FIO.2010.FThD3

Highly Simplified Device for Measuring the Intensity and Phase of Picosecond Pulses

Jacob Cohen, Dongjoo Lee, Vikrant Chauhan, and Rick Trebino

Frontiers in Optics 2010

Rochester, New York United States
24–28 October 2010
ISBN:

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Novel Measurement Techniques (FThD)

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J. Cohen, D. Lee, V. Chauhan, and R. Trebino, "Highly Simplified Device for Measuring the Intensity and Phase of Picosecond Pulses," in Frontiers in Optics 2010/Laser Science XXVI, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper FThD3.

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Abstract

We demonstrate an extremely simple high-spectral-resolution frequency-resolved-optical-gating (GRENOUILLE) device for measuring relatively long pulses. We report complete intensity-and-phase measurements of pulses up to 15ps long with time-bandwidth products over 100.

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