Abstract
Characterizing silicon nanophotonic waveguides with regard to local loss and distributed reflectivity, localized return loss, capture fraction, and properties of waveguide tapers is shown to be feasible. Our OFDR-based technique is reliable, fast and nondestructive.
© 2011 Optical Society of America
PDF ArticleMore Like This
Chien-I Lin and Thomas K. Gaylord
FWC6 Frontiers in Optics (FiO) 2011
Boris Desiatov, Ilya Goykhman, and Uriel Levy
JTuI53 CLEO: Applications and Technology (CLEO:A&T) 2011
Christy K. Y. Fung, Xia Chen, Gordon K. P. Lei, Chester Shu, and Hon Ki Tsang
C400 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2011