Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > ECEOC > 2022 > Mo3F > Mo3F.6
  • European Conference on Optical Communication (ECOC) 2022
  • Technical Digest Series (Optica Publishing Group, 2022),
  • paper Mo3F.6

Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters

Artemisia Tsiara, Younghyun Kim, Didit Yudistira, Bernardette Kunert, Marina Baryshnikova, Marianna Pantouvaki, Joris Van Campenhout, and Kristof Croes

Not Accessible

Your library or personal account may give you access

Abstract

We report the reliability assessment of carrier-depletion p-n diode GaAs/Si optical modulators monolithically integrated on a 300-mm Si wafer. Dark current remains stable under long accelerating aging tests. Devices without seed annealing experience a shift of Vπ.Lπ with no stress temperature dependence.

© 2022 The Author(s)

PDF Article
More Like This
Reliability studies of wafer-bonded InGaAs P-I-N photodetectors on GaAs substrates

F. B. Ejeckam, C. L. Chua, Z.-H. Zhu, Y. H. Lo, M. Hong, J. P. Mannaerts, and R. Bhat
CFC7 Conference on Lasers and Electro-Optics (CLEO:S&I) 1996

A high speed electro-optic phase shifter based on a polymerinfiltrated P-S-N diode capacitor

Maoqing Xin, Ching Eng Png, Soon Thor Lim, Vivek Dixit, and Aaron J. Danner
C793 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2011

Crossbar Wiring for III-V/Si MOS Optical Phase Shifters with Diode Selectors

Hanzhi Tang, Rui Tang, Junichi Fujikata, Masataka Noguchi, Shigeki Takahashi, Kasidit Toprasertpong, Shinichi Takagi, and Mitsuru Takenaka
We4E.4 European Conference and Exhibition on Optical Communication (ECOC) 2022

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use