Extended depth of field with absolute position detection in multi-wavelength digital holography

Markus Fratz; Tobias Seyler; Annelie Schiller; Alexander Bertz; Daniel Carl

doi:10.1364/DH.2022.W1A.7

Digital Holography and 3-D Imaging 2022
Technical Digest Series (Optica Publishing Group, 2022),
paper W1A.7
•https://doi.org/10.1364/DH.2022.W1A.7

Extended depth of field with absolute position detection in multi-wavelength digital holography

Markus Fratz, Tobias Seyler, Annelie Schiller, Alexander Bertz, and Daniel Carl

Digital Holography and Three-Dimensional Imaging 2022

Cambridge United Kingdom
1–4 August 2022
ISBN: 978-1-957171-12-8

From the session
Applications of Digital Holography II (W1A)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
M. Fratz, T. Seyler, A. Schiller, A. Bertz, and D. Carl, "Extended depth of field with absolute position detection in multi-wavelength digital holography," in Digital Holography and 3-D Imaging 2022, D. Chu, J. Park, C. Cheng, and P. Ferraro, eds., Technical Digest Series (Optica Publishing Group, 2022), paper W1A.7.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Get Video
Citation alert
Save article

Abstract

We present a novel approach for detecting the absolute position of surfaces in multi-wavelength holography. We extent the depth of field from ~0.08 mm to ~3 mm and get the absolute position with accuracies better than10 µm.

PDF Article | Presentation Video

Previous Article Next Article

Presentation Video

Presentation video access is available to:

Optica Publishing Group subscribers
Technical meeting attendees
Optica members who wish to use one of their free downloads. Please download the article first. After downloading, please refresh this page.

Contact your librarian or system administrator
or
Log in to access Optica Member Subscription or free downloads