Interferometric Localization Microscopy

Carl G. Ebeling; Amihai Meiri; Erik M. Jorgensen; Zeev Zalevsky; Jordan M. Gerton; Rajesh Menon

doi:10.1364/DH.2014.JTh1C.6

Digital Holography and Three-Dimensional Imaging 2014

Seattle, Washington United States
13–17 July 2014
ISBN: 978-1-55752-308-2

From the session
Joint Session With DH (JTh1C)

Interferometric Localization Microscopy

Carl G. Ebeling, Amihai Meiri, Erik M. Jorgensen, Zeev Zalevsky, Jordan M. Gerton, and Rajesh Menon

Imaging and Applied Optics 2014
OSA Technical Digest (online) (Optical Society of America, 2014),
paper JTh1C.6
•https://doi.org/10.1364/DH.2014.JTh1C.6

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C. G. Ebeling, A. Meiri, E. M. Jorgensen, Z. Zalevsky, J. M. Gerton, and R. Menon, "Interferometric Localization Microscopy," in Imaging and Applied Optics 2014, OSA Technical Digest (online) (Optical Society of America, 2014), paper JTh1C.6.

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Optics & Photonics Topics
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The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
Previously assigned OCIS codes
- Microscopy (180.0180)
- Interference microscopy (180.3170)
- Scanning microscopy (180.5810)

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Abstract

Interference of signal in Fourier space, emitted from single probes, is used to localize it by recording and computing the phase of the fringes. Such system has applications in super resolution localization microscopy.

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