Abstract
In this work, we demonstrate the focusing of a Gaussian laser beam, in silicon, by a vortex-shaped beam where both beams are at a wavelength of 775nm, which can sharpen the beam's PSF to improve the resolution in laser scanning microscopy.
© 2023 The Author(s)
PDF Article | Presentation VideoMore Like This
Nadav Shabairou, Maor Tiferet, Zeev Zalevsky, and Moshe Sinvani
FTu8B.6 Frontiers in Optics (FiO) 2020
Hadar Pinhas, Yossef Danan, Moshe Sinvani, Meir Danino, and Zeev Zalevsky
CTh3B.5 Computational Optical Sensing and Imaging (COSI) 2017
Nadav Shabairou, Zeev Zalevsky, and Moshe Sinvani
IW1C.4 Imaging Systems and Applications (IS) 2022