Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Frequency noise metrology of SiN microresonators with Qs of 100 million at the thermodynamical bounds

Not Accessible

Your library or personal account may give you access

Abstract

The thermorefractive noise of a high-quality factor silicon nitride resonator is measured in a vacuum chamber using Hz-linewidth laser. This scheme allows noise measurement without being concerned about laser frequency noise or environmental effects

© 2023 The Author(s)

PDF Article
More Like This
27Hz Integral Linewidth Laser Based on a 5-billion Q Microfabricated Reference Cavity

Andrei Isichenko, Flame Feng, Naijun Jin, Kaikai Liu, Mark W. Harrington, Peter T. Rakich, and Daniel J. Blumenthal
Th3A.2 Optical Fiber Communication Conference (OFC) 2023

Microresonator-based Low Noise Microwave Generation via Optical Frequency Division

William Groman, Igor Kudelin, Qing-Xin Ji, Joel Guo, Dahyeon Lee, Megan Kelleher, Takuma Nakamura, Charles A. McLemore, Warren Jin, Lue Wu, Wei Zhang, Joe Campbell, Andrey Matsko, Vladimir Iltchenko, John Bowers, Kerry Vahala, Frank Quinlan, and Scott A. Diddams
FW1E.2 Frontiers in Optics (FiO) 2023

Phase Noise and Spectral Bandwidth of SiN Microresonator Frequency Combs

V. Brasch, T. Herr, M. H. P. Pfeiffer, J. D. Jost, and T. J. Kippenberg
ID_P_3 International Quantum Electronics Conference (IQEC) 2013

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.