Long Live O-PCMs: Understanding Reliability Challenges of Optical Phase Change Materials

Cosmin-Constantin Popescu; Brian Mills; Brian Mills; Louis Martin Monier; Luigi Ranno; Yifei Zhang; Qingyang Du; Qingyang Du; Carlos Ríos; Carlos Ríos; Steven Vitale; Christopher Roberts; Paul Miller; Paul Miller; Vladimir Liberman; Hyun Jung Kim; Kiumars Aryana; Myungkoo Kang; Kathleen Richardson; Dennis Callahan; Sarah Geiger; Tian Gu; Juejun Hu

doi:10.1364/CLEO_SI.2023.STh1O.5

CLEO 2023
Technical Digest Series (Optica Publishing Group, 2023),
paper STh1O.5
•https://doi.org/10.1364/CLEO_SI.2023.STh1O.5

Long Live O-PCMs: Understanding Reliability Challenges of Optical Phase Change Materials

Cosmin-Constantin Popescu, Brian Mills, Louis Martin Monier, Luigi Ranno, Yifei Zhang, Qingyang Du, Carlos Ríos, Steven Vitale, Christopher Roberts, Paul Miller, Vladimir Liberman, Hyun Jung Kim, Kiumars Aryana, Myungkoo Kang, Kathleen Richardson, Dennis Callahan, Sarah Geiger, Tian Gu, and Juejun Hu

CLEO: Science and Innovations 2023

San Jose, CA United States
7–12 May 2023
ISBN: 978-1-957171-25-8

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C. Popescu, B. Mills, L. M. Monier, L. Ranno, Y. Zhang, Q. Du, C. Ríos, S. Vitale, C. Roberts, P. Miller, V. Liberman, H. J. Kim, K. Aryana, M. Kang, K. Richardson, D. Callahan, S. Geiger, T. Gu, and J. Hu, "Long Live O-PCMs: Understanding Reliability Challenges of Optical Phase Change Materials," in CLEO 2023, Technical Digest Series (Optica Publishing Group, 2023), paper STh1O.5.

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Abstract

The endurance of optical phase change material-based devices for integrated and free-space applications is explored and improvements are proposed based on limiting PCM dewetting, protective layer delamination, and elemental migration towards stable phases.

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