Solid-state beam scanner based on VCSEL integrated amplifier with scan resolution of over 200

Shanting Hu; Masashi Takanohashi; Xiaodong Gu; Keisuke Shimura; Fumio Koyama

doi:10.1364/CLEO_SI.2020.SM2M.2

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2020),
paper SM2M.2
•https://doi.org/10.1364/CLEO_SI.2020.SM2M.2

Solid-state beam scanner based on VCSEL integrated amplifier with scan resolution of over 200

Shanting Hu, Masashi Takanohashi, Xiaodong Gu, Keisuke Shimura, and Fumio Koyama

CLEO: Science and Innovations 2020

Washington, DC United States
10–15 May 2020
ISBN: 978-1-943580-76-7

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Imaging, Beam Scanning and Detection in Remote Sensing (SM2M)

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S. Hu, M. Takanohashi, X. Gu, K. Shimura, and F. Koyama, "Solid-state beam scanner based on VCSEL integrated amplifier with scan resolution of over 200," in Conference on Lasers and Electro-Optics, OSA Technical Digest (Optica Publishing Group, 2020), paper SM2M.2.

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Abstract

We demonstrate a solid-state beam scanner based on VCSEL-integrated amplifier for 3D sensing. We realized a record beam-steering angle of 16° with 200 resolution points. The integrated chip size is as small as 1 mm.

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