Abstract

We report a novel optical far-field, label-free, non-invasive technique which allows to reconstruct binary images of sub-wavelength nano-objects containing clusters of n elements separated by distances smaller than the Rayleigh limit, thus impossible to resolve with conventional microscopes (Fig.1a). Our super-resolution technique overcomes shortcomings of other super-resolution methods (e.g., sample labelling, sample contact, operation in vacuum) and find use in applications where retrieval of the number and localization of the positions of nano-objects is a key task, such as environmental pollution monitoring, semiconductor optical inspection, materials, and bio-medical analysis [1].

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