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Application of rigorous diffraction theory to scanning optical microscope problems

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Abstract

If a structure to be examined by a scanning optical microscope has a width less, or height greater than, a wavelength or if the microscope system has a high numerical aperture (NA) then scalar diffraction theory will break down and a more rigorous approach to the diffraction problem is required. With advances in technology producing smaller structures rigorous modelling of the microscope response becomes a necessity.

© 1998 IEEE

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