Abstract
The Z-scan(1) method is a well known simple and sensitive technique for measuring nonlinearities in bulk materials. A typical peak-valley transmittance curve is obtained from which it is easy to measure the nonlinear refraction (and/or absorption) coefficient of the material with a good sensitivity A modification of the technique, the Eclipsing Z-scan(2) (EZ-scan), where a disk is used instead of circular aperture has been also developed. It has been shown that the latter method is more sensitive, due to the fact that the relative changes of the transmitted power are larger than in the usual Z-scan.
© 1996 IEEE
PDF ArticleMore Like This
A. Marcano O. and A. Sena D.
QWD20 European Quantum Electronics Conference (EQEC) 1996
A. A. Said, M. Sheik-Bahae, T. H. Wei, J. Young, D. J. Hagan, M. J. Soileau, and E. W. Van Stryland
TUY3 OSA Annual Meeting (FIO) 1989
T. Xia, A.A. Said, M. Sheik-Bahae, F. Senesi, C. Wamsley, D.J. Hagan, and E.W. Van Stryland
MHH.2 OSA Annual Meeting (FIO) 1993