Abstract

Near-field optical microscopy and spectroscopy is a novel tool to image samples by light at a resolution better than 50 nm.¹ The non-propagating or evanescent parts of optical near-fields contain information on the sample with intensity variations on a small fraction of the wavelength. To probe optical near-fields either detector apertures, light sources, or a combination thereof with nanometer size are brought to within a distance of a few nanometers of the sample surface. These apertures scan the sample surface, with the gap controlled by force measurement or by distance dependent reflection or transmission of light. The illumination can be used to measure reflection, transmission, or to stimulate spectroscopic processes, such as fluorescence or luminescence.

© 1994 IEEE