Abstract

Phase interrogation of a guided-mode resonance (GMR) device has a better noise immunity than intensity-type interrogations. In this paper, we report the reflected-phase measurement results of the GMR device using the Pohl interferometer. Fringe shifts of the interferogram caused by the abrupt phase change of the resonantly reflected beam were observed by rotating the azimuth angle of the GMR device and without altering the reflected interference beam position, and the fringe shift can be captured and calculated by a fixed position camera. Our results demonstrate that the phase interrogation of the GMR device in sensing applications can be very compact and low-cost.

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