Determination of the optical constants of atomically thin MoS₂ by spectroscopic ellipsometry

Michele Merano

doi:10.1364/CLEOPR.2018.Th1G.4

CLEO Pacific Rim Conference 2018
OSA Technical Digest (Optica Publishing Group, 2018),
paper Th1G.4
•https://doi.org/10.1364/CLEOPR.2018.Th1G.4

Determination of the optical constants of atomically thin MoS₂ by spectroscopic ellipsometry

Michele Merano

Conference on Lasers and Electro-Optics/Pacific Rim 2018

Hong Kong China
29 July–3 August 2018
ISBN: 978-1-943580-45-3

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2D Nonlinear Materials (Th1G)

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M. Merano, "Determination of the optical constants of atomically thin MoS₂ by spectroscopic ellipsometry," in CLEO Pacific Rim Conference 2018, OSA Technical Digest (Optica Publishing Group, 2018), paper Th1G.4.

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Abstract

In literature, the optical constants of monolayer MoS₂ are extracted from experimental data modelling the crystal as a three dimensional slab. We use the surface current model, and compare the two procedures with surprising results.

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