A definition for O P M is given. Then, O P M parameters, requirements for O P M are discussed. Following is a review of several prevalent O P M techniques. At the end, the future challenges for O P M are proposed.

© 2009 IEEE

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription