Abstract
The nonlinear properties of Bi3.25sLa0.75Ti3O12 thin film grown on quartz substrate is measured using the Z-scan technique with ps-laser pulses at 532-nm wavelength. The nonlinear refractive index and absorption coefficients are 0.31 × 10−9 cm2 /W and 3 × 10−5 cm/W, respectively, indicating Bi3.25La0.75Ti3O12 film on quartz is a good candidate for applications in nonlinear optical devices.
© 2007 IEEE
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