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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Pacific Rim 2007
  • (Optica Publishing Group, 2007),
  • paper ThP_022

Sequential Variations of Fraunhofer Diffraction Pattern by Optical 4f Imaging System in As2S3 Thin Film

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Abstract

We observed sequential changes of Fraunhofer diffraction pattern due to photoinduced nonlinear refractive index changes in chalcogenide amorphous AS2S3 thin film by utilizing the optical 4f imaging system and also measured the power distribution of the temporal observed patterns.

© 2007 IEEE

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