Effect of Jitter on Linear Self-Referencing Pulse-Characterization Techniques

C. Dorrer

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper CTuU1

Effect of Jitter on Linear Self-Referencing Pulse-Characterization Techniques

C. Dorrer

Conference on Lasers and Electro-Optics 2008

San Jose, California United States
4–9 May 2008
ISBN: 978-1-55752-859-9

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Ultrafast Photonics III (CTuU)

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C. Dorrer, "Effect of Jitter on Linear Self-Referencing Pulse-Characterization Techniques," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper CTuU1.

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Abstract

The accuracy of modulator-based linear implementations of spectral shearing interferometry, simplified chronocyclic tomography, and spectrography when jitter is present on the electric modulator drive is studied analytically and simulated.

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