Abstract
Persistent spectral hole burning (PSHB)1 allows for frequency selective recording of holograms2 and opens interesting prospects toward high-density optical information storage and processing. When holography is performed in highly frequency selective recording materials, the hologram phase, i.e., the spatial position of the interference pattern, becomes a key variable to manipulate the diffraction properties of the holograms. In previous papers causality-related diffraction properties of thin PSHB holograms have been investigated,3,4 indicating that diffraction from the holograms recorded by means of spectral hole burning into the different diffraction orders is strongly dependent on the hologram phase. In this contribution we study the diffraction properties of holograms when different phase shifts are applied as functions of the recording frequency, and we show the results obtained when the phase is swept in conjunction with the electric field applied to the sample.
© 1993 Optical Society of America
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