Abstract
A novel and simple solution doping technique is used to explore the refractive index behavior of Al,P-doped SiO2 in the vicinity of the Al:P-ratio of 1:1 at low doping concentrations. It is found that even if Al:P = 1:1 is matched precisely an index increase is observed. This is in contradiction to previous findings in the literature and the already sophisticated models need to be refined in this region.
© 2017 Optical Society of America
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