Tip-enhanced Raman Spectroscopy for Nanoscale Characterization

Bin Ren

doi:10.1364/ASA.2017.ASu1A.3

The International Photonics and Optoelectronics Meeting 2017
OSA Technical Digest (online) (Optica Publishing Group, 2017),
paper ASu1A.3
•https://doi.org/10.1364/ASA.2017.ASu1A.3

Tip-enhanced Raman Spectroscopy for Nanoscale Characterization

Bin Ren

Advanced Spectroscopy and Applications 2017

Wuhan China
3–5 November 2017
ISBN: 978-1-943580-37-8

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Absorption Spectroscopy and Raman Spectroscopy (ASu1A)

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B. Ren, "Tip-enhanced Raman Spectroscopy for Nanoscale Characterization," in The International Photonics and Optoelectronics Meeting 2017, OSA Technical Digest (online) (Optica Publishing Group, 2017), paper ASu1A.3.

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Abstract

Tip-enhanced Raman spectroscopy can provide fingerprint information of samples at the nanometer spatial resolution. I present our current research on in-situ nanometer-resolution TERS imaging of bimetallic surfaces and 2D materials during the reaction process.

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