Abstract

Breakdown flashes in single-photon avalanche diodes can adversely affect low-level-photon experiments. We present the first measurement of this phenomenon at telecom wavelengths which is essential to the design and implement of preventive measures.

© 2016 Optical Society of America

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription