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Dielectric properties of conductively loaded polyimides in the far infrared

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Abstract

The dielectric properties of selected conductively-loaded polyimide samples are characterized in the microwave through far-infrared wavebands. These materials, belonging to the Vespel family, are more readily formed by direct machining than their ceramic-loaded epoxy counterparts and present an interesting solution for realizing absorptive optical control structures. Measurements spanning a spectral range from 1 to 600cm1 (0.03–18 THz) were performed and used in parametrization of the media’s dielectric function at frequencies below 3THz.

© 2018 Optical Society of America

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