Abstract

We demonstrate photoacoustic microscopy as a metrology method for the optical characterization and quality control of contact lenses (CLs). Dual-wavelength excitation is applied to CLs tinted on both sides with two thin ink layers, each of them possessing distinctly different optical absorption properties. Thus, the method is capable of measuring the elevation maps of both CL surfaces during two subsequent imaging sessions and extracting the CL thickness, curvatures, and dioptric power. We show that such an easily implementable technique provides robust, high-precision, cost-effective three-dimensional imaging and characterization of both rigid and soft CLs, which renders it highly favorable for a broad range of applications.

© 2017 Optical Society of America

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