Abstract

We present an optical study on high-quality and single-phase ${\mathrm{LiTi}}_2{\mathrm{O}}_4$ (LTO) superconductor thin films grown on $\mathrm{Mg}{\mathrm{Al}}_2{\mathrm{O}}_4$ substrates by pulsed laser deposition. The near infrared (NIR) reflectivity is measured for samples with (001) and (111) lattice orientations. The temperature-induced metal-superconductor transition can be observed, and the superconducting transition temperature can be measured for both samples. We find that the NIR reflection experiment can reflect rightly the basic features of LTO superconductor thin films. Furthermore, the results obtained from this simple optical measurement suggest that the photo-induced electronic localization effect can be present in LTO thin films in a metallic state. Such information cannot be obtained directly from conventional transport and magneto-transport measurements. These interesting and important findings demonstrate that the NIR reflection experiment is a powerful optical technique for contactless characterizations and investigations of superconductor materials.

© 2017 Optical Society of America

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