Abstract

The spatial distribution of the optical feedback field in an external-cavity diode laser (ECDL) is an important parameter influencing its lifetime and filamentation. From a modeling point of view, the evaluation of the full diffraction integral is required to calculate the propagation of light through thick lenses such as fast axis collimation lenses or beam transformation systems used for high-power diode lasers. In this Letter, we illustrate an algorithm for the accelerated computation of the Rayleigh–Sommerfeld diffraction integral on a graphics processing unit. We further show a validation of the results by measurements on an ECDL.

© 2021 Optical Society of America

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