Abstract
At the planar interface between a material and vacuum, the complex surface response $S(\omega) = [\varepsilon (\omega) - {{1}}]/[\varepsilon (\omega) { + } {{1}}]$, with $\varepsilon (\omega)$ being the relative complex dielectric permittivity of the material, exhibits resonances typical of the surface polariton modes, when $\varepsilon (\omega) \sim - {{1}}$. We show that for a moderately sharp resonance, ${\rm{S}}(\omega)$ is satisfactorily described with a mere (complex) Lorentzian, independent of the details affecting the various bulk resonances describing $\varepsilon (\omega)$. Remarkably, this implies a quantitative correlation between the resonant behaviors of $\Re {\rm{e}}[{\rm{S}}(\omega)]$ and $\Im {\rm{m}}[{\rm{S}}(\omega)]$, respectively, associated to the dispersive and dissipative effects in the surface near-field. We show that this “strong resonance” approximation easily applies and discuss its limits, based on published data for sapphire, ${\rm{Ca}}{{\rm{F}}_{2,}}$ and ${\rm{Ba}}{{\rm{F}}_2}$. An extension to interfaces between two media or to a non-planar interface is briefly considered.
© 2021 Optical Society of America
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