Abstract

355 nm high-reflective multilayer coatings with or without coevaporated interfaces (CEIs) were prepared by electron beam evaporation under the same deposition condition. Their transmission spectra, surface roughness, and mechanical stress properties were evaluated. Elemental composition analysis of the multilayer interfaces was performed using x-ray photoelectron spectroscopy, and laser-induced damage thresholds were obtained in both 1-on-1 and 300-on-1 testing modes. The coatings with CEIs reveal a lower mechanical stress and a higher laser damage resistance when irradiated with high laser fluence, and the corresponding damage modeling indicates that CEIs can significantly decrease defect density. The resulting damage morphologies show that CEI coatings can significantly suppress coating delamination and exhibit a “bulk-like” damage behavior, demonstrating better damage performance against high-power lasers.

© 2016 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Laser resistance dependence of interface for high-reflective coatings studied by capacitance-voltage and absorption measurement

Nuo Xu, Meiping Zhu, Yingjie Chai, Behshad Roshanzadeh, S. T. P. Boyd, Wolfgang Rudolph, Yuanan Zhao, Rong Chen, and Jianda Shao
Opt. Lett. 43(18) 4538-4541 (2018)

Impact of substrate pits on laser-induced damage performance of 1064-nm high-reflective coatings

Yingjie Chai, Meiping Zhu, Zhengyuan Bai, Kui Yi, Hu Wang, Yun Cui, and Jianda Shao
Opt. Lett. 40(7) 1330-1333 (2015)

Damage threshold influenced by the high absorption defect at the film–substrate interface under ultraviolet laser irradiation

Zhenkun Yu, Hongbo He, Wei Sun, Hongji Qi, Minghong Yang, Qiling Xiao, and Meiping Zhu
Opt. Lett. 38(21) 4308-4311 (2013)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (2)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (1)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription