Abstract
We demonstrate a split-contact corrugated ridge waveguide InGaAsP distributed feedback laser at 1560 nm. The laser cavity has been defined with uniform third-order gratings etched along the sidewalls of the ridge waveguide. The gratings were fabricated using a standard I-line stepper lithography technique along with an inductively coupled reactive ion-etching process. Stable single-mode operation has been achieved with side-mode suppression ratios , output powers , a wavelength tuning range , and narrow linewidths () for different biasing conditions, with a minimum of 70 kHz. The effect of p-contact partition on device performance is also studied.
© 2014 Optical Society of America
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