Abstract
We propose a new method for three-dimensional (3D) position measurement of nanoparticles using an in-line digital holographic microscope. The method improves the signal-to-noise ratio of the amplitude of the interference fringes to achieve higher accuracy in the position measurement by increasing weak scattered light from a nanoparticle relative to the reference light by using a low spatial frequency attenuation filter. We demonstrated the improvements of signal-to-noise ratio of the optical system and contrast of the interference fringes, allowing the 3D positions of nanoparticles to be determined more precisely.
© 2012 Optical Society of America
Full Article | PDF ArticleMore Like This
Kazufumi Goto and Yoshio Hayasaki
Opt. Lett. 40(14) 3344-3347 (2015)
Akira Sato, Quang Duc Pham, Satoshi Hasegawa, and Yoshio Hayasaki
Appl. Opt. 52(1) A216-A222 (2013)
Takayuki Higuchi, Quang Duc Pham, Satoshi Hasegawa, and Yoshio Hayasaki
Appl. Opt. 50(34) H183-H188 (2011)