Abstract
The unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a -shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain–metamaterial systems.
© 2012 Optical Society of America
Full Article | PDF ArticleMore Like This
Hai-Xu Cui, Fan Ye, Teng-Fei Li, Qing-Hua Guo, and Jing Chen
Opt. Lett. 37(19) 4041-4043 (2012)
Min-Cheol Park and Seung-Woo Kim
Opt. Lett. 26(7) 420-422 (2001)
Myun-Sik Kim, Toralf Scharf, Christoph Etrich, Carsten Rockstuhl, and Hans Herzig Peter
Opt. Lett. 37(3) 305-307 (2012)