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Deposited metamaterial thin film with negative refractive index and permeability in the visible regime

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Abstract

Thin films are fabricated from arrays of silver nanorods with thicknesses of 160nm and 200nm, to function as a metamaterial. The negative refractive index and negative permeability are retrieved from measured reflection and transmission coefficients using walk-off interferometer in the visible regime. A negative-index-material thin film with negative permittivity or (and) permeability can be produced by glancing angle deposition.

© 2011 Optical Society of America

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