Abstract

We report that a modified Z-scan method by nonlinear ellipse rotation (NER) can be used to discriminate true nonlinear refraction from thermal effect in the transient regime and steady state. The combination of Z-scan and NER allows us to measure the third-order nonlinear susceptibility component without the influence of thermal–optical nonlinearity. The experimental results of pure ${\mathrm{CS}}_2$ and ${\mathrm{CS}}_2$ solutions of nigrosine verify that the transient thermal effect can be successfully eliminated from the NER-modified Z-scan measurements. This method is also extended to the case in which thermal–optical nonlinearities depend on a high repetition rate of femtosecond laser pulses for the $N,N$-dimethylmethanamide solutions of graphene oxide.

© 2011 Optical Society of America

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