Abstract

We report a precise direct measurement of the Goos–Hänchen shift after one reflection off a dielectric interface coated with periodic metal stripes. The spatial displacement of the shift is determined by image analysis. A maximal absolute shift of 5.18 and 23.39μm for TE and TM polarized light, respectively, is determined. This technique is simple to implement and can be used for a large range of incident angles.

© 2008 Optical Society of America

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